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Obtaining Data from the Customer:
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Netlist Receipt
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Obtaining the post-compilation netlist) from the customer
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SDF and SDC timings receipt
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Obtaining timing & other constraints from
the customer
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Functional test vectors receipt
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Obtaining functional simulation vectors from the customer
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Completing Data Inputs:
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Equivalent Phys/PLL/Analog
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Finding equivalent analog cores in the ASIC process
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Equivalent Core/CPU/DSP/IP
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Finding equivalent complex digital cores
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Equivalent fab Libraries
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Defining required ASIC process and utilizing appropriate fab libraries
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Memories generation
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Generating the memories in the relevant ASIC process.
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Converting and Integrating:
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Netlist to netlist conversion
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Creating an ASIC netlist using our tools
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Integration
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Integrating with the equivalent core replacements using our tools
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Functional, toggle, fault and test coverage simulations
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Running all simulations to cover all potential issues
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FloorPlan / Area
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Performing placement, die area and power assessments
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Power and I/Os:
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Power analysis
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Defining die and package power limitations
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Pads design
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Defining I/O locations, area and power regions
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Package Preparations:
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Package power/size/pins
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Closing definitions with package-house
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Package test tool
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Closing the test tool development with the package house
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Fab test tool
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Closing tester definitions with the fab
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Timing Iterations:
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Timing closure
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Static Timing Analysis (STA) - Netlist iterations to close timing using our tools
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Clock tree
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Clock tree build up using our tools
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Formal
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Run Compare-tool between netlist iterations
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DFT (Design For Test) Logic Insertions:
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JTAG boundary scan
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Inserting JTAG machine and structures
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Scan chains
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Inserting scan chains on the entire logic and flip-flops
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BIST (Memory)
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Inserting Built-In-Self-Test machine over memories
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DFT integration
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Integrating all tests into the test methodology
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ATPG (Automatic Test Patterns Generation) vectors
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Creating ATPG vectors to run over scan chains
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JTAG vectors (including IDDQ)
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Creating JTAG vectors to run over JTAG & boundary chains
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BIST vectors
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Creating BIST vectors to run over BIST machines
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Run Functional test (Gate Level & SDF)
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Running Functional test simulation in Gate Level
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Run DFT tests (Gate Level & SDF)
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Running all DFT test vectors in Gate Level simulation
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DFT to tester format
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Translating all DFT vectors to test-house tester format
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Layout Iterations:
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Layout Place & Route
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Layout Place & Route iterations
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SDF
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Extract layout timings for Gate Level netlist simulations
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DRC/LVS
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Running checker tools on layout results
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GDS II
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Final results are ready for Tape-Out
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Tape Out dry run
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Running fab Tape-Out acceptance tests
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